ALL-MICRO Cross-Training Event: Feb 4-5, 2025
- Enhancing technical skills and fostering collaboration in optical and electron microscopy.
- Following an initial event in Italy in November 2024, the second phase of the ALL-MICRO cross-training event took place over two days in Slovenia.
- Participants engaged in hands-on training sessions covering various microscopy techniques. These included:
ALL-MICRO Cross-Training Event: Strengthening Microscopy Collaboration
Table of Contents
- ALL-MICRO Cross-Training Event: Strengthening Microscopy Collaboration
- Microscopy Collaboration: Q&A on the ALL-MICRO Cross-Training Event
- General Questions about the ALL-MICRO Event
- Microscopy Techniques Covered
- What microscopy techniques were covered during the first day of the event?
- what advanced microscopy tools were the focus of training on the second day?
- What is Transmission Electron Microscopy (TEM)?
- What is Scanning Electron Microscopy (SEM)?
- What is atomic force Microscopy (AFM)?
- What is Focused Ion Beam (FIB)?
- Key Microscopy Concepts
- Importance of the Event
- Microscopy Techniques: Summary Table
Enhancing technical skills and fostering collaboration in optical and electron microscopy.
ALL-MICRO cross-Training Event summary
Following an initial event in Italy in November 2024, the second phase of the ALL-MICRO cross-training event took place over two days in Slovenia. The primary goal was to enhance technical expertise, encourage networking, and strengthen collaboration between Italian and Slovenian partners in the field of optical and electron microscopy.
Day 1 – University of Nova Gorica, Ajdovščina (February 4, 2025)
Participants engaged in hands-on training sessions covering various microscopy techniques. These included:
- Sample preparation
- TEM (Transmission electron Microscopy)
- AFM (atomic Force Microscopy)
- SEM (Scanning Electron Microscopy)
- µ-Raman
to optimize learning, three working groups rotated through the different sessions. The day concluded with a tour of the laboratories.
day 2 – Nanocenter, Ljubljana (February 5, 2025)
Training at the Nanocenter focused on advanced microscopy tools, including:
- Focused Ion Beam (FIB)
- Four-Point Probe Microscopy
- Quantum Device Laboratories
The event wrapped up with a visit to the Jožef Stefan institute and the microscopy laboratories at the University of Nova Gorica.
Key Microscopy Concepts
The event highlighted the importance of understanding how images are formed in a compound microscope. With appropriate lens combinations, a microscope can magnify objects up to 1000 times.
As noted, the optical system of a microscope is like a “doppia lente di ingrandimento,” where the objective magnifies the object, and the eyepiece magnifies the image produced by the objective.
Conclusion
The event successfully promoted knowledge exchange to strengthen cross-border collaboration. Participants gained practical experience with advanced microscopy tools, reinforcing the ALL-MICRO project’s objective of creating a robust international network in the field of microscopy.
Microscopy Collaboration: Q&A on the ALL-MICRO Cross-Training Event
This article provides a thorough overview of the ALL-MICRO cross-training event, designed to enhance technical skills and foster collaboration in the field of optical and electron microscopy. Learn about the key takeaways, microscopy techniques covered, and the importance of international collaboration in advancing scientific knowledge.
General Questions about the ALL-MICRO Event
What was the ALL-MICRO cross-training event about?
The ALL-MICRO cross-training event was a two-day workshop held in Slovenia, following an initial event in Italy. Its primary goal was to enhance the technical expertise of participants, foster networking opportunities, and strengthen collaboration between Italian and Slovenian partners in optical and electron microscopy. the event included hands-on training sessions, lab tours, and focused on advanced microscopy tools and techniques.
When and where did the ALL-MICRO cross-training event take place?
The second phase of the ALL-MICRO cross-training event took place on Febuary 4th and 5th, 2025, in Slovenia. Day 1 was held at the University of Nova Gorica, Ajdovščina, and Day 2 was held at the nanocenter in Ljubljana. The first event was held in Italy in November of 2024.
What was the main objective of the ALL-MICRO event?
The main objective was to enhance technical expertise, facilitate networking among researchers, and strengthen collaboration between Italian and Slovenian partners within the field of optical and electron microscopy. This supports the development of a robust international network.
Microscopy Techniques Covered
What microscopy techniques were covered during the first day of the event?
On the first day, participants received hands-on training in the following microscopy techniques:
Sample planning
TEM (Transmission Electron Microscopy)
AFM (Atomic Force Microscopy)
SEM (Scanning Electron Microscopy)
µ-raman
what advanced microscopy tools were the focus of training on the second day?
The second day of training at the Nanocenter focused on advanced microscopy tools such as:
Focused Ion Beam (FIB)
Four-Point Probe Microscopy
Quantum Device Laboratories
What is Transmission Electron Microscopy (TEM)?
TEM, or Transmission Electron Microscopy, is a microscopy technique in which a beam of electrons is transmitted thru an ultra-thin specimen, interacting with the specimen as it passes through. an image is formed from the electrons that are transmitted through the specimen, magnified, and focused onto an imaging device, such as a fluorescent screen, photographic film, or a sensor such as a CCD camera. TEM can provide highly detailed images of internal structures, often at the atomic level.
What is Scanning Electron Microscopy (SEM)?
SEM, or Scanning Electron Microscopy, is a type of electron microscopy that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain data about the surface topography and composition of the sample. the electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the detected signal to produce an image. SEM provides high-resolution images of a sample’s surface and is widely used in materials science, biology, and other fields.
What is atomic force Microscopy (AFM)?
AFM, or Atomic Force Microscopy, is a technique used to image, measure, and manipulate matter at the nanoscale. A sharp tip (probe) at the end of a cantilever is used to scan the surface of a sample. When the tip approaches the sample, forces between the tip and the sample lead to a deflection of the cantilever. By measuring this deflection, properties such as topography, friction, and magnetic forces can be measured.
What is Focused Ion Beam (FIB)?
FIB, or Focused Ion Beam, is a technique similar to SEM, but rather of using electrons, it uses a focused beam of ions (usually gallium ions) to image, analyze, and modify materials at the micro- and nanoscale. The ion beam can be used to sputter away the material,allowing for precise milling,cutting,or deposition of materials. FIB is commonly used in sample preparation for TEM, circuit editing, and failure analysis.
Key Microscopy Concepts
How does a compound microscope work?
A compound microscope uses a system of lenses to magnify small objects, frequently enough up to 1000 times with appropriate lens combinations. The optical system consists of:
Objective Lens: This lens initially magnifies the object.
Eyepiece Lens: This lens further magnifies the image produced by the objective lens, providing the final magnified view.
In essence, it functions as a “doppia lente di ingrandimento” (double magnifying glass).
Importance of the Event
What was the impact of the ALL-MICRO cross-training event?
The event successfully promoted knowledge exchange and strengthened cross-border collaboration between Italian and Slovenian partners. Participants gained practical experience with advanced microscopy tools, thereby enhancing their technical skills and contributing to the ALL-MICRO project’s goal of establishing a strong international network in the field of microscopy.
Why is collaboration critically important in the field of microscopy?
Collaboration in microscopy is crucial for:
Knowledge Sharing: Enables the exchange of expertise and best practices.
Resource Optimization: Allows researchers to share and access advanced equipment and facilities.
Innovation: Fosters the development of new techniques and applications through interdisciplinary collaboration.
Networking: Builds a strong community of experts, accelerating research and problem-solving.
Microscopy Techniques: Summary Table
| Technique | What it Does | Key Applications |
| —————————– | ————————————————————————————————————————————– | —————————————————————————————————————- |
| TEM (transmission Electron Microscopy) | Transmits a beam of electrons through a sample to create a highly magnified image of its internal structure. | Study of cell structures, viruses, materials science. |
| SEM (Scanning Electron Microscopy) | Scans the surface of a sample with a focused electron beam to produce detailed images of its surface topography. | Surface analysis of materials, forensic science, quality control. |
| AFM (Atomic Force Microscopy) | Uses a sharp tip to scan a surface and measure forces between the tip and sample to create a nanoscale image. | Imaging of surfaces at atomic resolution,studying mechanical properties of materials. |
| FIB (Focused Ion Beam) | Uses a focused beam of ions to image,analyze,and modify materials at the micro and nanoscale.Can be used for milling or deposition. | Sample preparation for TEM, circuit editing, failure analysis. |